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IEC TR 62258-8:2008 EN
Semiconductor die products - Part 8: EXPRESS model schema for data exchange
现行
发布日期 :
1970-01-01
实施日期 :
IEC 63068-4:2022 EN
Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 4: Procedure for identifying and evaluating defects using a combined method of optical inspection and photoluminescence
现行
发布日期 :
1970-01-01
实施日期 :
IEC 60747-15:2010 EN-FR
Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices
REVISED
发布日期 :
1970-01-01
实施日期 :
IEC 60747-15:2024 EN-FR
Semiconductor devices - Part 15: Discrete devices - Isolated power semiconductor devices
现行
发布日期 :
1970-01-01
实施日期 :
IEC 60050-523:2018 EN-FR
International Electrotechnical Vocabulary (IEV) - Part 523: Micro-electromechanical devices
现行
发布日期 :
1970-01-01
实施日期 :
IEC 60747-16-1:2001 EN-FR
Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers
现行
发布日期 :
1970-01-01
实施日期 :